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Bi-optimal Quantile-based Test Planning for Accelerated Degradation Test Based on Wiener Process

Authors: Ya-Shan Cheng, Chien-Yu Peng

Publication: Statistica Sinica

Published: Jan 1, 2028

Source: Crossref

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Bi-optimal Quantile-based Test Planning for Accelerated Degradation Test Based on Wiener Process

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