Новый рентгеновский метод определения динамических характеристик дислокаций, генерированных в блок-кристалле интерферометра

<jats:p>A new highly sensitive X-ray interferometric method is proposed for investigating the dynamic characteristics of dislocations as a function of their density and displacement. The dependence of the moiré fringe period on these parameters has been determined. The average dislocation density near the center of the scratch, the average dislocation mean free path, and the extent of the dislocation group aligned along the scratch have been calculated. An explanation for the origin of the distortion of interference fringes on moiré topograms is presented. It has been experimentally demonstrated that these distortions are caused by a scratch formed on the surface of the crystal block of the X-ray interferometer. Several parameters of the scratch have been determined.</jats:p>