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Deep learning assisted ellipsometry informed thickness predictive capabilities of van der Waals crystals from conventional optical microscopy images

Authors: Ani Khachatryan, Artsruni Margaryan, Maksim Sargsyan et al.

Publication: Optical Materials

Published: Nov 1, 2026

Source: Crossref

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Deep learning assisted ellipsometry informed thickness predictive capabilities of van der Waals crystals from conventional optical microscopy images

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